The invention provides a short-circuit-preventing signal test probe applied to IC tests. The short-circuit-preventing signal test probe includes a test probe having a lower end head used for touching a pin of a to-be-tested piece and an insulation sheet having two side arms formed by bending two ends downwardly along the body. The test probe is arranged through the center of the insulation sheet. The two side arms are disposed on two sides of the test probe. The lower ends of the two side arms contact with the head of the test probe closely. Lower ends of the two side arms are longer than the head of the test probe. By using the short-circuit-preventing signal test probe, testing time can be reduced and working efficiency can be improved. Damages to the to-be-tested piece due to short circuit can be avoided. At the same time, testing cost is reduced.