The invention discloses a dynamic and static joint test system for a single photon detector, which comprises a digital source meter, a variable temperature device, a test circuit and an oscilloscope, wherein an avalanche diode is placed in a heat preservation box in the variable temperature device, the cathode of the avalanche diode is connected with the output end of the digital source meter, the anode of the avalanche diode is connected with the input end of the test circuit, the output waveform of the avalanche diode is connected onto the input end of the oscilloscope, and the output end of the test circuit is connected onto a computer. Due to different temperature, different over bias and different dead time, the formation of dark current is changed, a dynamic and static joint test method is used for separation, and thus, dynamic and static joint real-time debugging is realized; and the formation of the dark current is determined, the dark current formation determination method is easy to realize, and thus, the dark current formation can not only be calculated theoretically but also proved easily experimentally.