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Invention Grant
CN106531225B 晶圆级动态预烧测试方法 有权 转让

晶圆级动态预烧测试方法
Abstract:
一种晶圆级动态预烧测试方法。于预烧测试期间反复切换各字线组的致能状态，并依据测试图案数据于字线组再次被致能时变换对位线施加的电压。
Abstract(English):

A wafer level dynamic pre-burning test method is provided. The energization state of each word line group is repeatedly switched during the pre-firing test and the voltage applied to the bit line is converted according to the test pattern data when the word line group is again energized.

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