A debris direct reflection embedded microscope comprises a focus mechanism 1 and a reflected light source 5 into the pole gap of the electromagnetic debris deposition device 3 for on-line visual ferrograph. A reflection ferrogram is imaged directly other than though the oil film in the oil tunnel. The focus mechanism 1 is composed of a lens sleeve 10, a limit threaded sleeve 11, a focus threaded sleeve 14 and a connecting seat 2. An image sensor 13 is on the top of the focus mechanism 1 and a lens 12 is inside the lens sleeve 10. The focus mechanism 1 and reflected light source 5 are placed in the internal space of the electromagnetic debris deposition device 3, and the center optical axis of the focus mechanism 1 coincides with the center axis of the electromagnetic debris deposition device 3. The focus mechanism 1 and reflected light source 5 are fixed in the connecting seat 2, and the connecting seat 2 connects the focus mechanism 1 and the magnetic poles 3-1 together. A transmission light source 6 is a bi-color flat light source. Resolution and image contrast of ferrograms are improved by adjusting intensities of the reflected light source 5 and transmission light source 6.