The present invention discloses a circuit structure for measuring a capacitor mismatch characteristic and a measurement method. The circuit structure comprises a first capacitor array, a second capacitor array, a first digital-to-analog converter, a second digital-to-analog converter, a comparator, successive approximation register logic, and a plurality of switches. According to a small-sized capacitor, the first capacitor array generates voltage containing capacitor mismatch through the switching mechanisms of the switches; the successive approximation register logic, the digital-to-analog converters, the comparator and an offset compensation capacitor bank form a successive approximation register analog-to-digital converter (SAR ADC); the input offset voltage of the comparator is calibrated; the voltage containing the capacitor mismatch information is quantized into digital signals; the digital signals are outputted from the output port of the successive approximation register logic; and a condition that a probe is adopted to directly measure a capacitance value can be avoided.