The present invention discloses a solid-state atomic spin sensing structure surface stress noise ultra high precision test system. The system comprises a probe, the probe, the probe comprises a diamond substrate, a diamond NV color center waveguide is processed at the middle portion of the upper surface of the diamond substrate, a diamond refractive index matching layer coated with the NV color center waveguide is grown at the upper surface of the diamond substrate and is taken as a reflecting film, a microstrip antenna array is processed at the upper surface of the diamond substrate, a microstrip antenna port is arranged at the microstrip antenna array and is connected with a microwave source, and the upper surface of the microstrip antenna array is plated with a piezomagnetic film. The solid-state atomic spin sensing structure surface stress noise ultra high precision test system employs the diamond substrate embedded with the NV color center waveguide as a sensing unit, employs the laser to realize electronic energy level transition, the piezomagnetic film in a pressure probe is under external pressure through scanning of microwave to generate a magnetic field correlated to the size of the pressure, and the difference of microwave frequencies corresponding to two peak values of a fluorescence intensity spectral line is employed to perform calibration of pressure so as to realize ultrahigh precision measurement of the pressure.