The invention discloses a Flash-type FPGA (Field Programmable Gate Array) test method based on an ATE test platform. The method comprises steps of Flash-type FPGA device on chip resource partitioning, FPGA device on chip resource configuration scheme design, configuration file and test vector file generation, and ATE test. Thus, test on FPGA device functions is realized, the functions and the performance of the FPGA device before use can meet relevant index requirements, and the phenomenon that the functions and the performance of the circuit can not meet requirements due to failure of the FPGA device itself can be avoided.