A device (100), and corresponding method, includes a pump light source (102) configured to be modulated at a pump modulation and to irradiate a target specimen (112). The device also includes a probelight source (106) arranged to generate a speckle pattern (114) from the target specimen, as well as a sensor (110)configured to detect changes in at least one of position and intensity of one or morespeckle lobes of the speckle pattern having correlation with the pump modulation. The device and method are used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles,and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.