The present invention provides a probe, an inspection jig, an inspection unit, and an inspection device, the probe being capable of contacting an object to be inspected in a direction different from acontact direction of the inspection device, the inspection jig being provided with the probe, the inspection unit being provided with the inspection jig, and the inspection device being provided withthe inspection unit. A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.