The invention discloses a clamping type probe assembly, wherein the clamping type probe assembly includes a first clamping member, second clamping members, first conductive members, and stop members.The first clamping member includes a first assembly segment and a first clamping segment. The second clamping members include second assembly segments and second clamping segments which are connectedwith each other, and the second assembly segments are disposed on the first assembly segment. The conductivity of the first conductive members is greater than the conductivity of the second clamping members, and the rigidity of the second clamping members is greater than the rigidity of the first conductive members. The first conductive members include first stack segments and second stack segments, the first conductive members pass through the second clamping members, and the first stack segments and the second stack segments are respectively located on opposite sides of the second clamping members, and are stacked on the second assembly segments and the second clamping members. The stop members include connection segments and stop segments which are connected with each other, the connection segments are disposed on the f first assembly segment or the second assembly segments, and the stop segments are located beside the first clamping segment and the second clamping segments.