Provided by the present application is a method for obtaining emission probability, the method comprising: obtaining a plurality of measurement reports (MRs) for a terminal in a target area and engineering parameters of at least one base station in the target area, obtaining a feature vector corresponding to each MR respectively in the plurality of MRs according to parameter information for each MR in the plurality of MRs and the engineering parameters of the at least one base station; obtaining a single point positioning model by means of processing position information of each MR in the plurality of MRs and the feature vector corresponding to each MR in the plurality of MRs using a regression model; calculating emission probability of the feature vector corresponding to each MR in the plurality of MRs according to the single point positioning model, the position information of each MR in the plurality of MRs, and the feature vector corresponding to each MR in the plurality of MRs.