The invention relates to a peak force tapping and twisting resonance combination method based on an atomic force microscope technology. According to the method, a combined mode of a peak force tappingmode and a torsional resonance mode is used for performing imaging and sample physical property measurement and representation, the peak force tapping mode is utilized to control the interaction between a tip and a sample, and the torsional resonance mode is utilized to measure transverse physical properties of the sample while the peak force tapping mode works. Through the method, the defect that the torsional resonance mode has a special requirement on the sample is overcome, and the problem that the vertical interaction force between the tip and the sample is large in the torsional resonance mode is solved.