Invention Grant
- Patent Title: Energy analysis method for hidden damage detection
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Application No.: US14709887Application Date: 2015-05-12
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Publication No.: US10006886B2Publication Date: 2018-06-26
- Inventor: Cara A. Campbell Leckey
- Applicant: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- Current Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- Current Assignee Address: US DC Washington
- Agent Andrea Z. Warmbier; Robin W. Edwards; Mark P. Dvorscak
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G01N29/24 ; G01N29/44

Abstract:
A method of detecting internal defects in composites or other multilayer materials includes generating a wavefield on a surface of the material. Wavefield data is collected from the wavefield on the surface, and the measured wavefield data is processed to provide measured energy data. The method may include generating simulated or predicted energy data for the multilayer material that is compared to the simulated energy data to determine if the multilayer material has internal defects or damage below the surface. The method can be utilized to detect and/or quantify damage or other defects that are “hidden” by damage that is closer to the surface of the material.
Public/Granted literature
- US20160011151A1 Energy Analysis Method for Hidden Damage Detection Public/Granted day:2016-01-14
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