Invention Grant
- Patent Title: Testing and setting performance parameters in a semiconductor device and method therefor
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Application No.: US14484546Application Date: 2014-09-12
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Publication No.: US10006959B2Publication Date: 2018-06-26
- Inventor: Darryl G. Walker
- Applicant: Darryl G. Walker
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/02 ; G11C7/04 ; G11C29/02 ; G11C29/50 ; G01R31/28 ; G11C29/00 ; G11C11/406
Abstract:
A method of determining temperature ranges and setting performance parameters in a semiconductor device that may include at least one temperature sensing circuit is disclosed. The temperature sensing circuits may be used to control various operating parameters to improve the operation of the semiconductor device over a wide temperature range. The performance parameters may be set to improve speed parameters and/or decrease current consumption over a wide range of temperature ranges.
Public/Granted literature
- US20160054377A1 TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR Public/Granted day:2016-02-25
Information query
