Invention Grant
- Patent Title: Chip performance monitoring system and method
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Application No.: US15134781Application Date: 2016-04-21
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Publication No.: US10006964B2Publication Date: 2018-06-26
- Inventor: Margaret R. Charlebois , Christopher D. Hanudel , Robert D. Herzl , David W. Milton , Clarence R. Ogilvie , Paul M. Schanely , Tad J. Wilder
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Gibb & Riley, LLC
- Agent Steven J. Meyers, Esq.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3177 ; G06F1/08 ; G06F11/34 ; G01R31/3185 ; G01R31/317

Abstract:
Disclosed are a chip performance monitoring system, method and a computer program product, wherein a performance monitor output signal is propagated through an adjacent scan chain to avoid signal degradation incident to across-chip transmission of high frequency signals. Since the clock signal frequency used to control signal propagation through the scan chain will typically be less than twice the performance monitor output signal frequency, frequency sub-sampling with aliasing occurs. To compensate, signal propagation through the scan chain can be controlled during different time periods using different clock signals having different clock signal frequencies and, during these different time periods, different data outputs can be captured at an output node of the scan chain. The data output frequencies of these different data outputs can be measured and the performance monitor output signal frequency can be determined based on the different data output frequencies given the different clock signal frequencies.
Public/Granted literature
- US20160231379A1 CHIP PERFORMANCE MONITORING SYSTEM AND METHOD Public/Granted day:2016-08-11
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