Invention Grant
- Patent Title: 3D localization microscopy and 4D localization microscopy and tracking methods and systems
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Application No.: US15342615Application Date: 2016-11-03
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Publication No.: US10007103B2Publication Date: 2018-06-26
- Inventor: Christian Soeller , David Michael Baddeley , Mark Bryden Cannell
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pedersen, P.A.
- Priority: NZ588199 20100924
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G02B21/00 ; G02B21/14 ; G02B21/16 ; H04N13/02 ; G06T7/194 ; G06T7/00 ; H04N17/00 ; G06T5/00 ; G06T7/73 ; G06K9/62 ; G06K9/46 ; G01N21/64

Abstract:
A 3D localization microscopy system, 4D localization microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.
Public/Granted literature
- US20170168283A1 3D LOCALIZATION MICROSCOPY AND 4D LOCALIZATION MICROSCOPY AND TRACKING METHODS AND SYSTEMS Public/Granted day:2017-06-15
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