Invention Grant
- Patent Title: Channel-last replacement metal-gate vertical field effect transistor
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Application No.: US15297345Application Date: 2016-10-19
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Publication No.: US10008596B2Publication Date: 2018-06-26
- Inventor: Karthik Balakrishnan , Kangguo Cheng , Pouya Hashemi , Alexander Reznicek
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Louis Percello
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/08 ; H01L29/10 ; H01L29/423 ; H01L29/66

Abstract:
A method of making a vertical transistor includes forming a doped source on a substrate; depositing a sacrificial gate material on the source; forming a trench in the sacrificial gate material to expose the doped source; growing an epitaxial layer within the trench to form a channel region extending from the doped source and through the sacrificial gate material; performing an epitaxial growth process to grow an epitaxial layer on a portion of the channel region to form a drain over the sacrificial gate material; depositing a dielectric material on the drain to form a spacer that protects the epitaxial growth; and removing the sacrificial gate material and replacing the sacrificial gate material with a gate stack that surrounds the channel region between the doped source and the drain.
Public/Granted literature
- US20170179282A1 CHANNEL-LAST REPLACEMENT METAL-GATE VERTICAL FIELD EFFECT TRANSISTOR Public/Granted day:2017-06-22
Information query
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