Invention Grant
- Patent Title: Spectroscope and method for producing spectroscope
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Application No.: US15116990Application Date: 2015-02-03
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Publication No.: US10012538B2Publication Date: 2018-07-03
- Inventor: Takafumi Yokino , Katsumi Shibayama
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2014-020666 20140205
- International Application: PCT/JP2015/053001 WO 20150203
- International Announcement: WO2015/119117 WO 20150813
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/18 ; G01J3/02 ; G01J3/36

Abstract:
A spectrometer includes a light detection element having a substrate made of a semiconductor material, a light passing part provided in the substrate, and a light detection part put in the substrate, a support having a base wall part opposing the light detection element, and side wall parts integrally formed with the base wall part, the light detection element being fixed to the side wall parts, the support being provided with a wiring electrically connected to the light detection part, and a dispersive part provided on a surface of the base wall part on a side of a space. An end part of the wiring is connected to a terminal of the light detection element. An end part of the wiring is positioned on a surface in the base wall part on an opposite side from the side of the space.
Public/Granted literature
- US20160356649A1 SPECTROSCOPE AND METHOD FOR PRODUCING SPECTROSCOPE Public/Granted day:2016-12-08
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