A passive infrared sensor having a radiation capture component may be housed within a sensor device. The device may also house radiation emission components, such as light emitting diodes, in proximity to the capture component. Electronic circuitry within the device may generate a signal that causes the emission components to emit radiation that includes wavelengths in the infrared spectrum. The infrared radiation may be captured at the capture component. Characteristics of a signal generated by the capture component may be compared to test characteristics. Based on this comparison, it may be determined that the passive infrared sensor is not operating properly.