Invention Grant
- Patent Title: Soft error detection in a memory system
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Application No.: US15239563Application Date: 2016-08-17
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Publication No.: US10013192B2Publication Date: 2018-07-03
- Inventor: Andrew C. Russell
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F3/06 ; G06F11/10 ; G11C29/52

Abstract:
An integrated circuit (IC) device including a first memory device, a second memory device stacked with the first memory device, and one or more memory controllers configured to detect a first error in data stored in the first memory device at a first physical location in the IC device, and upon detecting the first error, determine whether there is a second error in data stored in the second memory device in a second physical location in the IC device near the first physical location.
Public/Granted literature
- US20180052615A1 SOFT ERROR DETECTION IN A MEMORY SYSTEM Public/Granted day:2018-02-22
Information query