Invention Grant
- Patent Title: Data path integrity verification in memory devices
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Application No.: US13919135Application Date: 2013-06-17
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Publication No.: US10014070B2Publication Date: 2018-07-03
- Inventor: Terry Grunzke
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/02
Abstract:
Methods and memories for verifying data path integrity are provided. In one such method, a first set of data are read from a first register of a memory device while a second set of data are written to an array of the memory device. The read first set of data and the data written to the first register are compared to verify data path integrity.
Public/Granted literature
- US20140198580A1 DATA PATH INTEGRITY VERIFICATION Public/Granted day:2014-07-17
Information query
