Invention Grant
- Patent Title: Method for acquiring image and ion beam apparatus
-
Application No.: US15279055Application Date: 2016-09-28
-
Publication No.: US10014157B2Publication Date: 2018-07-03
- Inventor: Tomokazu Kozakai , Fumio Aramaki , Osamu Matsuda , Kensuke Shiina , Kazuo Aita , Anto Yasaka
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2015-192660 20150930
- Main IPC: A61N5/00
- IPC: A61N5/00 ; H01J37/22 ; H01J37/20 ; H01J37/28

Abstract:
A method for acquiring an image, in which an image of an image acquiring region is acquired by radiating an ion beam to a sample having a conducting part with a linear edge on a dielectric substrate, includes performing an equal-width scan of the ion beam in a first direction that obliquely intersects the linear edge and sweep in a second direction intersecting the first direction. The ion beam is sequentially scanned in different patterns on different scan regions of parallelogram shape, each of which includes the image acquiring region. Secondary charged particles are detected to generate image data of all the scan regions, and image data of the scan regions are calculated to generate image data of the image acquiring region. The image data of the image acquiring region are synthesized to display the image data of the image acquiring region.
Public/Granted literature
- US20170092461A1 METHOD FOR ACQUIRING IMAGE AND ION BEAM APPARATUS Public/Granted day:2017-03-30
Information query