Invention Grant
- Patent Title: Method of manufacturing semiconductor device
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Application No.: US15629989Application Date: 2017-06-22
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Publication No.: US10014171B2Publication Date: 2018-07-03
- Inventor: Yukinori Aburatani , Shin Hiyama , Tsuyoshi Takeda , Naofumi Ohashi
- Applicant: Hitachi Kokusai Electric Inc.
- Applicant Address: JP Tokyo
- Assignee: Hiatchi Kokusai Electric, Inc.
- Current Assignee: Hiatchi Kokusai Electric, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Edell, Shapiro & Finnan LLC
- Priority: JP2016-123516 20160622
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
Described herein is a technique capable of improving the productivity of manufacturing of a semiconductor device in a method of processing a film by repeating different processes. A method of manufacturing a semiconductor device may include: (a) loading a substrate into a process vessel; (b) forming a first layer by supplying a first gas into the process vessel by a gas supply unit while maintaining the substrate at a first temperature by a temperature control unit; and (c) forming a second layer different from the first layer by supplying a second gas different from the first gas into the process vessel by the gas supply unit while maintaining the substrate at a second temperature different from the second temperature by the temperature control unit.
Public/Granted literature
- US20170372894A1 Method of Manufacturing Semiconductor Device Public/Granted day:2017-12-28
Information query
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