Invention Grant
- Patent Title: Combined surface inspection using multiple scanners
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Application No.: US15347281Application Date: 2016-11-09
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Publication No.: US10018570B2Publication Date: 2018-07-10
- Inventor: Luke C. Ingram , Anthony W. Baker , Steven A. Dorris , Christopher P. Bellavia
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Kwan & Olynick LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88

Abstract:
Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.
Public/Granted literature
- US20180128751A1 COMBINED SURFACE INSPECTION USING MULTIPLE SCANNERS Public/Granted day:2018-05-10
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