Invention Grant
- Patent Title: Measurement apparatus
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Application No.: US15057561Application Date: 2016-03-01
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Publication No.: US10018722B2Publication Date: 2018-07-10
- Inventor: Yuya Nishikawa , Yoshiyuki Kuramoto
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2015-046345 20150309
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01S17/42 ; H04N5/225 ; G01S17/89 ; H04N9/04 ; H04N5/357 ; G01S17/02 ; G01S7/481

Abstract:
The present invention provides a measurement apparatus for measuring one of a position and an attitude of a measurement target, including an image sensor including one pixel unit in which a plurality of pixels adjacent to each other are arranged in a matrix and configured to capture the measurement target illuminated with a pattern light of a first wavelength and a light of a second wavelength and obtain a first image corresponding to the pattern light of the first wavelength and a second image corresponding to the light of the second wavelength, and an optical member configured to separate the pattern light of the first wavelength and the light of the second wavelength and make one of the pattern light of the first wavelength and the light of the second wavelength enter each pixel of the one pixel unit.
Public/Granted literature
- US20160266255A1 MEASUREMENT APPARATUS Public/Granted day:2016-09-15
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