Invention Grant
- Patent Title: X-ray image pickup apparatus, X-ray image pickup method, and X-ray image pickup apparatus monitoring method
-
Application No.: US14914355Application Date: 2014-10-22
-
Publication No.: US10022099B2Publication Date: 2018-07-17
- Inventor: Yushi Tsubota , Fumito Watanabe , Yasutaka Konno , Shinichi Kojima , Keisuke Yamakawa , Shinji Kurokawa
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-227126 20131031
- International Application: PCT/JP2014/078099 WO 20141022
- International Announcement: WO2015/064446 WO 20150507
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03 ; G01N23/087 ; G01N23/046

Abstract:
A change of X-ray radiation quality due to a material existing between an X-ray source and a detection element is estimated and corrected. Accordingly, deterioration of material discrimination ability in a dual energy imaging method can be prevented. An X-ray imaging apparatus is provided with an inherent filtration calculator configured to use measured data obtained by imaging air at two or more types of different tube voltages to calculate a deviation from a reference radiation quality, as a transmission length (inherent filtration) of a predetermined reference material. A reference-material transmission-length conversion is applied to the measured data according to the dual energy imaging method, thereby calculating the reference material transmission length (inherent filtration). When a subject is imaged, the dual energy imaging is performed by adding the inherent filtration calculated as to each detection element, and this produces an image with the change of radiation quality having been corrected.
Public/Granted literature
Information query