Invention Grant
- Patent Title: Inductive measuring probe and method for operating an inductive measuring probe
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Application No.: US15039157Application Date: 2014-11-25
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Publication No.: US10024693B2Publication Date: 2018-07-17
- Inventor: Jean-Louis Sohler , René Ohlmann
- Applicant: ADDI-DATA GmbH
- Applicant Address: DE Rheinmuenster
- Assignee: ADDI-DATA GmbH
- Current Assignee: ADDI-DATA GmbH
- Current Assignee Address: DE Rheinmuenster
- Agency: Collard & Roe, P.C.
- Priority: DE102013113073 20131126
- International Application: PCT/DE2014/100413 WO 20141125
- International Announcement: WO2015/078448 WO 20150604
- Main IPC: G01R15/18
- IPC: G01R15/18 ; G01D5/22 ; G01D5/244

Abstract:
The invention proposes an inductive measuring probe and a method for operating the measuring probe. The measuring probe is equipped with a movably arranged probe element, with a sensor (1) having a coil arrangement (14) and a core (15) which is arranged such that it can be displaced in relation to the coil arrangement (14) and which is connected to the probe element, wherein the sensor (1) converts a deflection of the probe element into an analog measurement signal, with an electrical reference component (2) which converts an analog input voltage into an analog output voltage, with a drive device which generates an identical analog input voltage for the sensor (1) and the reference component (2), with a processing device which determines the influence of disturbing effects from the analog output voltage of the reference component (2), and which determines a measurement result from the measurement signal and the influence of disturbing effects.
Public/Granted literature
- US20170138767A1 INDUCTIVE MEASURING PROBE AND METHOD FOR OPERATING AN INDUCTIVE MEASURING PROBE Public/Granted day:2017-05-18
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