Invention Grant
- Patent Title: Timing skew characterization apparatus and method
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Application No.: US14539669Application Date: 2014-11-12
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Publication No.: US10024906B2Publication Date: 2018-07-17
- Inventor: Chao Kai Chuang , Yen-Chien Lai , Hung-Jen Liao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317 ; H03K5/14 ; G01R31/319

Abstract:
A device comprises a coarse timing skew characterization circuit having a buffer chain and a coarse delay cell calibration circuit comprising a first flip-flop, a second flip-flop and a logic gate, wherein the coarse delay cell calibration circuit is configured to measure a delay between an input of the buffer chain and an output of the buffer chain.
Public/Granted literature
- US20150069994A1 Timing Skew Characterization Apparatus and Method Public/Granted day:2015-03-12
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