Invention Grant
- Patent Title: Magnetic field measurement method and magnetic field measurement apparatus
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Application No.: US14953122Application Date: 2015-11-27
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Publication No.: US10024931B2Publication Date: 2018-07-17
- Inventor: Kimio Nagasaka , Mitsutoshi Miyasaka , Satoshi Takahashi
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2014-243866 20141202; JP2015-154818 20150805
- Main IPC: G01R33/26
- IPC: G01R33/26 ; A61B5/00 ; A61B5/05 ; G01R33/032 ; A61B5/04

Abstract:
In a magnetic field measurement apparatus, a light source irradiates a gas cell with linearly polarized light serving as pump light and probe light in a Z axis direction, and a magnetic field generator applies alternating magnetic fields which have the same cycle and different phases to the gas cell in each of X axis and Y axis directions. A calculation controller calculates a magnetic field C (Cx, Cy, Cz) of a measurement region using X axis and Y axis components Ax and Ay of the alternating magnetic fields, and a spin polarization degree Mx corresponding to a measurement value W− from a magnetic sensor.
Public/Granted literature
- US20160154072A1 MAGNETIC FIELD MEASUREMENT METHOD AND MAGNETIC FIELD MEASUREMENT APPARATUS Public/Granted day:2016-06-02
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