Invention Grant
- Patent Title: Method and system to prepare, manufacture and inspect mask patterns for a semiconductor device
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Application No.: US14536031Application Date: 2014-11-07
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Publication No.: US10025175B2Publication Date: 2018-07-17
- Inventor: Chi-Ming Tsai , Chih-Chiang Tu , Wen-Hao Cheng , Ru-Gun Liu , Shuo-Yen Chou
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G03F1/36 ; G03F1/78

Abstract:
A system and method that includes receiving a layout of an integrated circuit (IC) device. A template library is provided having a plurality of parameterized shape elements. A curvilinear feature of layout is classified by selecting at least one of the parameterized shape elements that defines the curvilinear feature. A template index is associated with the layout is formed that includes the selected parameterized shape element. The template index and the layout can be delivered to a mask writer, which uses the template index and the layout to fabricate a pattern on a photomask.
Public/Granted literature
- US20160132627A1 METHOD AND SYSTEM TO PREPARE, MANUFACTURE AND INSPECT MASK PATTERNS FOR A SEMICONDUCTOR DEVICE Public/Granted day:2016-05-12
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