Invention Grant
- Patent Title: System on chip and integrated circuit for performing skew calibration using dual edge and mobile device including the same
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Application No.: US15285633Application Date: 2016-10-05
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Publication No.: US10025345B2Publication Date: 2018-07-17
- Inventor: Phil Jae Jeon , Gyeong Han Cha
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0139901 20151005; KR10-2016-0052831 20160429
- Main IPC: G06F9/00
- IPC: G06F9/00 ; G06F1/12 ; G06F1/10 ; H04L7/00

Abstract:
A system on chip is provided. The system on chip includes a delay control circuit configured to generate delayed clock signals having different delays, based on each of a first rising edge and a first falling edge of an input clock signal, and generate delayed data signals having different delays, based on each of a second rising edge and a second falling edge of an input data signal. The system on chip further includes a de-skew control circuit configured to control the delay control circuit to adjust a delay of each of the first rising edge, the first falling edge, the second rising edge, and the second falling edge.
Public/Granted literature
Information query