Invention Grant
- Patent Title: Device and method for detecting defects in self-capacitive touch panel
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Application No.: US14907967Application Date: 2015-11-23
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Publication No.: US10025438B2Publication Date: 2018-07-17
- Inventor: Qiang Gong , Chao Wang
- Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd. , Wuhan China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Shenzhen CN Wuhan
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.,WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.,WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen CN Wuhan
- Agency: Buchanan Ingersoll & Rooney, PC
- Priority: CN201510746158 20151105
- International Application: PCT/CN2015/095311 WO 20151123
- International Announcement: WO2017/075850 WO 20170511
- Main IPC: G06F3/044
- IPC: G06F3/044 ; G06F3/041

Abstract:
Disclosed is a device and a method for detecting defects in a self-capacitive touch panel. The device for detecting defects is provided with a plurality of drive circuits respectively connected to a plurality of rows of touch electrodes. The drive circuit comprises: a pre-charging unit, a synchronization unit, an output unit, and a cutoff unit. The device is capable of further detecting a short circuit defect existing between rows of touch electrodes in a touch electrode matrix.
Public/Granted literature
- US20180173335A1 DEVICE AND METHOD FOR DETECTING DEFECTS IN SELF-CAPACITIVE TOUCH PANEL Public/Granted day:2018-06-21
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