Invention Grant
- Patent Title: Information processing system and failure diagnosis method
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Application No.: US15191705Application Date: 2016-06-24
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Publication No.: US10025657B2Publication Date: 2018-07-17
- Inventor: Takenori Oku , Hiroshi Nishida , Kentaro Seo , Shunsuke Hayashi , Yusuke Shibata , Yuuta Sano , Satoshi Mizuno , Takeyoshi Sekine , Fumihiro Nagano , Satoshi Hatanaka , Kenji Ueda
- Applicant: Takenori Oku , Hiroshi Nishida , Kentaro Seo , Shunsuke Hayashi , Yusuke Shibata , Yuuta Sano , Satoshi Mizuno , Takeyoshi Sekine , Fumihiro Nagano , Satoshi Hatanaka , Kenji Ueda
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2015-129737 20150629; JP2015-134316 20150703
- Main IPC: G06F11/07
- IPC: G06F11/07 ; H04N1/00

Abstract:
An information processing system includes a storage unit that stores and associates a cause of a failure that has occurred in an electronic device, state information of the electronic device at the time the failure has occurred in the electronic device due to the cause of the failure, and a measure to be implemented in response to the cause of the failure. The information processing system further includes at least one processor that performs an acquisition process for acquiring the state information of the electronic device, and a failure diagnosis process for determining the cause of the failure that has occurred in the electronic device and the measure to be implemented in response to the cause of the failure based on the acquired state information of the electronic device.
Public/Granted literature
- US20160378584A1 INFORMATION PROCESSING SYSTEM AND FAILURE DIAGNOSIS METHOD Public/Granted day:2016-12-29
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