Invention Grant
- Patent Title: Risk evaluation system for process system, risk evaluation program and risk evaluation method
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Application No.: US15300909Application Date: 2015-03-31
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Publication No.: US10025658B2Publication Date: 2018-07-17
- Inventor: Kenta Ihara , Yoshio Miyamae
- Applicant: TLV Co., Ltd.
- Applicant Address: JP Hyogo
- Assignee: TLV Co., Ltd.
- Current Assignee: TLV Co., Ltd.
- Current Assignee Address: JP Hyogo
- Agency: The Webb Law Firm
- Priority: JP2014-075095 20140401
- International Application: PCT/JP2015/060293 WO 20150331
- International Announcement: WO2015/152317 WO 20151008
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G05B23/02

Abstract:
A risk evaluation system includes a storage unit, an operation unit, a calculation unit, a risk evaluation unit and a display unit. The calculation unit calculates first and second factors for use in risk evaluation relating to specific constituent devices on the basis of predetermined information about the specific constituent devices. The risk evaluation unit generates risk evaluation information to be used for displaying a device risk evaluation matrix defined by two axes of the first factor and the second factor and including plot images plotted based on the first and second factors of the specific constituent devices. Further, the risk evaluation unit generates the device risk evaluation information in identifiable displaying mode to allow identification of plot images of specific constituent devices constituting a same process.
Public/Granted literature
- US20170024267A1 Risk Evaluation System for Process System, Risk Evaluation Program and Risk Evaluation Method Public/Granted day:2017-01-26
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