Invention Grant
- Patent Title: Dynamically measuring the integrity of a computing apparatus
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Application No.: US14747322Application Date: 2015-06-23
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Publication No.: US10025925B2Publication Date: 2018-07-17
- Inventor: Todd P. Carpenter , Steven J. Johnston , Ian J. De Silva
- Applicant: Adventium Enterprises, LLC
- Applicant Address: US MN Minneapolis
- Assignee: Adventium Enterprises, LLC
- Current Assignee: Adventium Enterprises, LLC
- Current Assignee Address: US MN Minneapolis
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F21/55
- IPC: G06F21/55
Abstract:
The present disclosure includes methods and systems for measuring the integrity of a device. A number of embodiments can include initiating an observatory in a system and initiating a remote manager. A number of embodiments can also include measuring the integrity of the device from the observatory and accessing the integrity measurement of the device from the remote manager.
Public/Granted literature
- US20160379000A1 DYNAMICALLY MEASURING THE INTEGRITY OF A COMPUTING APPARATUS Public/Granted day:2016-12-29
Information query
