Invention Grant
- Patent Title: Clustering method with a two-stage local binary pattern and an iterative image testing system thereof
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Application No.: US15272186Application Date: 2016-09-21
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Publication No.: US10026013B2Publication Date: 2018-07-17
- Inventor: Ming-Der Shieh , Fang-Kai Hsu , Chun-Wei Chen , Der-Wei Yang
- Applicant: NCKU Research and Development Foundation , Himax Technologies Limited
- Applicant Address: TW Tainan TW Tainan
- Assignee: NCKU Research and Development Foundation,Himax Technologies Limited
- Current Assignee: NCKU Research and Development Foundation,Himax Technologies Limited
- Current Assignee Address: TW Tainan TW Tainan
- Agency: Stout, Uxa & Buyan, LLP
- Agent Donald E. Stout
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T3/40 ; G06T7/20

Abstract:
A clustering method with a two-stage local binary pattern includes generating a gradient direction value according to a center sub-block and neighbor sub-blocks of a patch of an image; quantizing the gradient direction value, thereby generating a quantized gradient direction value; generating a gradient magnitude value according to the gradient direction value; quantizing the gradient magnitude value, thereby generating a quantized gradient magnitude value; concatenating the quantized gradient direction value and the quantized gradient magnitude value to generate a two-stage local binary pattern (2SLBP) value; and performing clustering of super-resolution imaging by using the 2SLBP value as an index.
Public/Granted literature
- US20180082149A1 CLUSTERING METHOD WITH A TWO-STAGE LOCAL BINARY PATTERN AND AN ITERATIVE IMAGE TESTING SYSTEM THEREOF Public/Granted day:2018-03-22
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