Invention Grant
- Patent Title: Ray tracing apparatus and method
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Application No.: US15335723Application Date: 2016-10-27
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Publication No.: US10026214B2Publication Date: 2018-07-17
- Inventor: Youngsam Shin , Wonjong Lee , Seokjoong Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0149724 20151027
- Main IPC: G06T15/06
- IPC: G06T15/06 ; G06T15/80 ; G06T7/00 ; G06T15/20 ; G06T17/10 ; G06T1/20 ; G06T7/40

Abstract:
A ray tracing apparatus includes a traversal (TRV) core configured to traverse an acceleration structure (AS) to detect a first node and a second node, which intersect with a generated ray and have a determined same parent node, and to determine whether the ray intersects with an overlap region where a first bounding box corresponding to the first node overlaps a second bounding box corresponding to the second node; and, an intersection test (IST) determiner configured to calculate a first hit point where the ray intersects with a primitive belonging to the first node, which is a closer node to a view point of the ray among the first node and the second node, and to determine a final hit point of the ray based on a result of the determining of whether the ray intersects with respect to an overlap region, by the TRV core.
Public/Granted literature
- US20170116775A1 RAY TRACING APPARATUS AND METHOD Public/Granted day:2017-04-27
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |