Invention Grant
- Patent Title: Abnormality diagnostic device and method therefor
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Application No.: US15263953Application Date: 2016-09-13
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Publication No.: US10026240B2Publication Date: 2018-07-17
- Inventor: Toru Ezawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2015-246483 20151217
- Main IPC: G07C5/08
- IPC: G07C5/08 ; B61K9/00 ; B61L27/00 ; G06N99/00 ; B61L15/00 ; B61L25/02 ; B61L25/04

Abstract:
According to one embodiment, an abnormality diagnostic device includes processing circuitry. The processing circuitry learns, based on a model generated from sensor data of a diagnostic object in a railroad vehicle, a data selection condition for selecting the sensor data utilized to diagnose the diagnostic object. The processing circuitry diagnoses abnormality of the diagnostic object based on the sensor data satisfying the data selection condition and a diagnostic model representing a relation between the sensor data and the abnormality of the diagnostic object.
Public/Granted literature
- US20170178426A1 ABNORMALITY DIAGNOSTIC DEVICE AND METHOD THEREFOR Public/Granted day:2017-06-22
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