Invention Grant
- Patent Title: Substrate processing apparatus
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Application No.: US14462657Application Date: 2014-08-19
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Publication No.: US10026596B2Publication Date: 2018-07-17
- Inventor: Daisuke Hayashi
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2009-081898 20090330
- Main IPC: H01L21/00
- IPC: H01L21/00 ; C23C16/00 ; H01J37/32 ; H01L21/67

Abstract:
A substrate processing apparatus includes: a cylindrical shaped chamber configured to accommodate a substrate; a movable electrode capable of moving along a central axis of the cylindrical shaped chamber within the cylindrical shaped chamber; a facing electrode facing the movable electrode within the cylindrical shaped chamber; and an expansible/contractible partition wall connecting the movable electrode with an end wall on one side of the cylindrical shaped chamber. A high frequency power is applied to a first space between the movable electrode and the facing electrode, a processing gas is introduced thereto, and the movable electrode is not in contact with a sidewall of the cylindrical shaped chamber, a first dielectric member is provided at the cylindrical shaped chamber's sidewall facing the movable electrode, and an overlap area between the first dielectric member and a side surface of the movable electrode is changed according to movement of the movable electrode.
Public/Granted literature
- US20140352890A1 SUBSTRATE PROCESSING APPARATUS Public/Granted day:2014-12-04
Information query
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