- Patent Title: Plasma processing apparatus and heater temperature control method
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Application No.: US15428313Application Date: 2017-02-09
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Publication No.: US10026631B2Publication Date: 2018-07-17
- Inventor: Kaoru Oohashi
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2012-005590 20120113
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/311 ; H01L21/3213 ; H01L21/683 ; H01J37/32 ; H01L21/3065 ; H01L21/66 ; H02N13/00

Abstract:
A plasma processing apparatus is provided that converts a gas into plasma using a high frequency power and performs a plasma process on a workpiece using an action of the plasma. The plasma processing apparatus includes a processing chamber that can be depressurized, a mounting table that is arranged within the processing chamber and holds the workpiece, an electrostatic chuck that is arranged on the mounting table and electrostatically attracts the workpiece by applying a voltage to a chuck electrode, a heater arranged within or near the electrostatic chuck, and a temperature control unit. The heater is divided into a circular center zone, at least two middle zones arranged concentrically at an outer periphery side of the center zone, and an edge zone arranged concentrically at an outermost periphery. The temperature control unit adjusts a control temperature of the heater with respect to each of the zones.
Public/Granted literature
- US20170213751A1 PLASMA PROCESSING APPARATUS AND HEATER TEMPERATURE CONTROL METHOD Public/Granted day:2017-07-27
Information query
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