Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US15064971Application Date: 2016-03-09
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Publication No.: US10026715B2Publication Date: 2018-07-17
- Inventor: Ippei Kume , Kazuyuki Higashi
- Applicant: TOSHIBA MEMORY CORPORATION
- Applicant Address: JP Minato-ku
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2015-053874 20150317
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L23/31 ; H01L21/768 ; H01L23/48 ; H01L23/00

Abstract:
A semiconductor device according to the present embodiment includes a semiconductor substrate, an insulating film and a conductive film. The insulating film is disposed on a first surface of the semiconductor substrate. The insulating film covers a semiconductor element. The conductive film penetrates the semiconductor substrate across from the first surface to a second surface opposite to the first surface. On the second surface, a trench continuously or intermittently exists across from a first end part side of the second surface to a second end part side thereof.
Public/Granted literature
- US20160276313A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2016-09-22
Information query
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