Invention Grant
- Patent Title: High voltage semiconductor devices including main conductive pattern, auxiliary conductive pattern, and spacer therebetween
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Application No.: US15626573Application Date: 2017-06-19
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Publication No.: US10026819B2Publication Date: 2018-07-17
- Inventor: Myoungsoo Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2016-0087000 20160708
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L29/423 ; H01L29/06 ; H01L29/08 ; H01L23/535 ; H01L29/49 ; H01L29/66 ; H01L29/10 ; H01L21/3213

Abstract:
The semiconductor device including a device isolation layer disposed in a substrate and defining an active region, a first conductive pattern on the active region, an impurity region in the active region on a side of the first conductive pattern, a second conductive pattern on the active region between the impurity region and the first conductive pattern, a first spacer between the first conductive pattern and the second conductive pattern, and a contact plug disposed on and electrically connected to the first conductive pattern may be provided. The second conductive pattern may have a width less than a width of the contact plug.
Public/Granted literature
- US20180012970A1 SEMICONDUCTOR DEVICES Public/Granted day:2018-01-11
Information query
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