Invention Grant
- Patent Title: Parameter adjustment for pattern discovery
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Application No.: US14398017Application Date: 2012-05-30
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Publication No.: US10027686B2Publication Date: 2018-07-17
- Inventor: Zhipeng Zhao , Yanlin Wang , Anurag Singla
- Applicant: Zhipeng Zhao , Yanlin Wang , Anurag Singla
- Applicant Address: US CA Sunnyvale
- Assignee: ENTIT SOFTWARE LLC
- Current Assignee: ENTIT SOFTWARE LLC
- Current Assignee Address: US CA Sunnyvale
- International Application: PCT/US2012/040022 WO 20120530
- International Announcement: WO2013/180708 WO 20131205
- Main IPC: G06F11/00
- IPC: G06F11/00 ; H04L29/06 ; H04L12/26 ; G06F12/14
Abstract:
Pattern discovery performed on event data may include selecting an initial set of parameters for the pattern discovery. The parameters may specify conditions for identifying a pattern in the event data. A pattern discovery run is executed on the event data based on the initial set of parameters, and a parameter may be adjusted based on the output of the pattern discovery run.
Public/Granted literature
- US20150106922A1 PARAMETER ADJUSTMENT FOR PATTERN DISCOVERY Public/Granted day:2015-04-16
Information query
