Invention Grant
- Patent Title: 2T-1R architecture for resistive RAM
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Application No.: US15039784Application Date: 2014-12-04
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Publication No.: US10037801B2Publication Date: 2018-07-31
- Inventor: Deepak Chandra Sekar , Wayne Frederick Ellis , Brent Steven Haukness , Gary Bela Bronner , Thomas Vogelsang
- Applicant: HEFEI RELIANCE MEMORY LIMITED
- Applicant Address: CN Hefei
- Assignee: Hefei Reliance Memory Limited
- Current Assignee: Hefei Reliance Memory Limited
- Current Assignee Address: CN Hefei
- Agency: Sheppard, Mullin, Richter & Hampton LLP
- International Application: PCT/US2014/068624 WO 20141204
- International Announcement: WO2015/085093 WO 20150611
- Main IPC: G11C8/10
- IPC: G11C8/10 ; G11C13/00 ; G11C7/08

Abstract:
A memory device includes a plurality of resistive memory cells and a plurality of word lines. Each resistive memory cell includes a resistive memory element, a first switching element electrically coupled in series with the resistive memory element, and a second switching element electrically coupled in series with the first switching element. The first switching element and the second switching element in each resistive memory cell is coupled to different ones of the word lines.
Public/Granted literature
- US20160379710A1 2T-1R ARCHITECTURE FOR RESISTIVE RAM Public/Granted day:2016-12-29
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