Invention Grant
- Patent Title: Semiconductor memory device capable of shortening erase time
-
Application No.: US15422640Application Date: 2017-02-02
-
Publication No.: US10037812B2Publication Date: 2018-07-31
- Inventor: Noboru Shibata
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Minato-ku
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-322415 20071213; JP2007-338363 20071227
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/34 ; G11C16/14 ; G11C16/26 ; G11C16/10

Abstract:
In a memory cell array, a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines are arranged in a matrix. A control circuit controls the potentials of said plurality of word lines and said plurality of bit lines. In an erase operation, the control circuit erases an n number of memory cells (n is a natural number equal to or larger than 2) of said plurality of memory cells at the same time using a first erase voltage, carries out a verify operation using a first verify level, finds the number of cells k (k≤n) exceeding the first verify level, determines a second erase voltage according to the number k, and carries out an erase operation again using the second erase voltage.
Public/Granted literature
- US20170148524A1 SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SHORTENING ERASE TIME Public/Granted day:2017-05-25
Information query