Invention Grant
- Patent Title: Methods and apparatus for detecting and localizing partial conductor failures of implantable device leads
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Application No.: US14224281Application Date: 2014-03-25
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Publication No.: US10039919B2Publication Date: 2018-08-07
- Inventor: Mark W. Kroll , Charles D. Swerdlow
- Applicant: Lambda Nu Technology LLC
- Applicant Address: US MN Orono
- Assignee: Lambda Nu Technology LLC
- Current Assignee: Lambda Nu Technology LLC
- Current Assignee Address: US MN Orono
- Agency: Patterson Thuente Pedersen, P.A.
- Main IPC: A61N1/08
- IPC: A61N1/08 ; A61N1/05 ; A61B5/0424

Abstract:
Method and apparatus for diagnosis of conductor anomalies, such as partial conductor failures, in an implantable lead for an implantable medical device are disclosed. In various embodiments, small changes in the lead impedance are identified by the use of a small circuit element that is incorporated as part of the distal end of the implantable lead. In various embodiments, the small circuit element is electrically connected to a lead conductor and/or electrode of the implantable lead. Methods of diagnosing conductor anomalies in accordance with these embodiments generate measured values that depend only on the impedance of the conductors and electrodes of the lead, and not on the behavior of the conductor-tissue interface and other body tissues.
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