Invention Grant
- Patent Title: Self-learning test chart optimizing system
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Application No.: US15334447Application Date: 2016-10-26
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Publication No.: US10040277B2Publication Date: 2018-08-07
- Inventor: Hanno Hoffstadt , Zoran Subotin
- Applicant: GMG GmbH & Co. KG
- Applicant Address: DE Tübingen
- Assignee: GMG GMBH & CO. KG
- Current Assignee: GMG GMBH & CO. KG
- Current Assignee Address: DE Tübingen
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: EP15191512 20151026
- Main IPC: B41F33/00
- IPC: B41F33/00 ; B41F5/24 ; H04N1/60

Abstract:
In order to improve a method for optimization in the creation of test charts with the aim of improving the quality of prioritization, the invention proposes a method for optimizing a plurality of test patch-comprising test charts for printing purposes, wherein a prioritization of the test patches is carried out on the basis of the specification of the target printing method, the intended number of colors as well as the color identification and the intended mixing intentions, and a compilation of test patches is made according to that prioritization, wherein the test chart is printed, the printed test chart is colorimetrically measured, and the result is used for optimizing the prioritization.
Public/Granted literature
- US20170113454A1 Self-Learning Test Chart Optimizing System Public/Granted day:2017-04-27
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