Invention Grant
- Patent Title: Three-dimensional shape measurement apparatus
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Application No.: US15057943Application Date: 2016-03-01
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Publication No.: US10041783B2Publication Date: 2018-08-07
- Inventor: Akihiro Fujii , Yosuke Tani
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2015-053192 20150317
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/22 ; G01B11/24 ; G06T7/00 ; G06T7/571

Abstract:
A technology is provided that makes it possible for even a beginner to determine whether a measurement result is correct, to thereby prevent the use of incorrect measurement data, and to improve the reliability of an analysis result. In a three-dimensional shape measurement apparatus 100 that measures a three-dimensional shape of a specimen 3 in a non-contacting manner, a score that evaluates the reliability of measurement data is calculated for each measurement point by use of information obtained during a process of estimating the height of the specimen 3 or the estimated height. Measurement data is processed according to a result of evaluating the measurement data for each measurement point by use of the score.
Public/Granted literature
- US20160275689A1 THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS Public/Granted day:2016-09-22
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