Invention Grant
- Patent Title: Microscope and method for 3D high-resolution localization microscopy with an enlarged measurement region
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Application No.: US14889417Application Date: 2014-04-25
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Publication No.: US10042153B2Publication Date: 2018-08-07
- Inventor: Thomas Kalkbrenner
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Duane Morris LLP
- Priority: DE102013208415 20130507
- International Application: PCT/EP2014/058451 WO 20140425
- International Announcement: WO2014/180680 WO 20141113
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G02B5/30 ; G02B21/00 ; G02B21/16 ; G02B21/18 ; G01N21/64 ; H04N13/20 ; H04N13/271

Abstract:
A microscope for high-resolution imaging of a sample in a depth direction and transversely thereto has an excitation beam path for illuminating a sample,—an imaging beam path with an objective and two detectors,—and a phase element. The phase element is situated in a pupil of the imaging beam path and has a different influence on two halves of the pupil cross section. The imaging beam path is split into two partial imaging beam paths downstream of the pupil as seen in the imaging direction, which partial imaging beam paths each lead to one of the two detectors. The two partial imaging beam paths have imaging lengths that differ by a specific wavelength difference such that the two detectors record images of the sample from two different focal planes, which are spaced apart by a distance in the depth direction.
Public/Granted literature
- US20160085062A1 MICROSCOPE AND METHOD FOR 3D HIGH-RESOLUTION LOCALIZATION MICROSCOPY WITH AN ENLARGED MEASUREMENT REGION Public/Granted day:2016-03-24
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