Invention Grant
- Patent Title: Second order detection of two orthogonal dithers for I/Q modulator bias control
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Application No.: US15179704Application Date: 2016-06-10
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Publication No.: US10042190B2Publication Date: 2018-08-07
- Inventor: Tiangong Liu , Hongbing Lei , Xiao Shen
- Applicant: Futurewei Technologies, Inc.
- Applicant Address: US TX Plano
- Assignee: Futurewei Technologies, Inc.
- Current Assignee: Futurewei Technologies, Inc.
- Current Assignee Address: US TX Plano
- Agency: Conley Rose, P.C.
- Main IPC: H04B10/50
- IPC: H04B10/50 ; G02F1/01 ; G02F1/225 ; H04B10/516 ; H04B10/58 ; H04B10/69 ; H04J14/08 ; G02F1/21
Abstract:
A Dual Parallel (DP)-Inphase/Quadrature (I/Q) Mach-Zehnder Modulator (MZM) bias controller configured to generate a pair of orthogonal dither signals; multiply the pair of dither signals to create a second order orthogonal dither signal; and lock an Inphase (I) I MZM of a DP-I/Q MZM to a value of a corresponding I component of a transmission signal by applying the pair of orthogonal dither signal to a Quadrature (Q) MZM and a Phase (P) MZM of the DP-I/Q MZM; applying an I bias signal to the I MZM of the DP-I/Q MZM; detecting an output of the DP-I/Q MZM; and determining an I error signal in the output of the I MZM of the DP-I/Q MZM based on the product of second order dither signal and the output of the DP-I/Q MZM.
Public/Granted literature
- US20170357110A1 Second Order Detection of Two Orthogonal Dithers for I/Q Modulator Bias Control Public/Granted day:2017-12-14
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